ligitek electronics co.,ltd. property of ligitek only doc. no : qw0905-ldd405/65-xx/rp20 rev. : a date : 09 - feb. - 2006 data sheet ldd405/65-xx/rp20 dual digit led display (0.40 lnch)
note : 1.all dimension are in millimeters and (lnch) tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. ligitek electronics co.,ltd. property of ligitek only package dimensions part no. ldd405/65-xx/rp20page 1/7 ldd405/65-xx/rp20 ligitek 2.45x7= 17.15(0.675") 6.9 (0.272") 12.6 (0.496") 16.0 (0.630") 20.2 (0.795") 10.16 (0.40") dig.1dig.2 20 0.5 pin no.1 1.3(0.051") ? 0.51 typ. dig.2 b c dp a e d f
internal circuit diagram page 2/7 ligitek electronics co.,ltd. property of ligitek only 5 4 dig.1 dig.1 13 15 b a 1513 ab dig.2 8 12 10 16 14 2 3 1 d c f e g b a 9 11 7 6 d c f e g 8 16 ldd4065-xx/rp20 4 1 3 14 2 10 12 cdef g dig.2 ab 9 5 7 6 11 cdefg ldd4055-xx/rp20 part no. ldd405/65-xx/rp20
electrical connection page 3/7 ligitek electronics co.,ltd. property of ligitek only cathode b dig.1 cathode g dig.1 cathode a dig.1 cathode f dig.1 common anode dig.2 common anode dig.1 cathode c dig.1 cathode e dig.1 cathode d dig.1 cathode d dig.2 cathode e dig.2 cathode c dig.2 cathode g dig.2 cathode a dig.2 cathode b dig.2 cathode f dig.2 anode c dig.1 1 2 3 anode e dig.1 anode d dig.1 common cathode dig.1 common cathode dig.2 anode d dig.2 anode b dig.1 13 anode a dig.1 14 15 anode b dig.2 anode f dig.2 anode a dig.2 anode g dig.2 anode c dig.2 anode e dig.2 12 11 10 9 8 7 6 4 5 anode g dig.1 anode f dig.1 16 13 15 16 14 11 12 10 8 9 6 7 2 4 5 3 1 pin no. ldd4055-xx/rp20 pin no. ldd4065-xx/rp20 part no. ldd405/65-xx/rp20
electrical part selection and application information(ratings at 25) solder temperature 1/16 inch below seating plane for 3 seconds at 260 emitted red note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. ldd4065-xx/rp20 ldd4055-xx/rp20 gaalas part no material chip common anode common cathode 660 common cathode or anode p ( nm) 20 1.51.8 2.4 min. (nm) vf(v) typ. max. reverse current per any chip storage temperature operating temperature tstg t opr ir -25 ~ +85 -25 ~ +85 10 2:1 3.055.0 iv-m iv(mcd) typ. min. a ligitek electronics co.,ltd. property of ligitek only absolute maximum ratings at ta=25 forward current per chip power dissipation per chip peak forward current per chip (duty 1/10,0.1ms pulse width) parameter sr i fp pd i f 100 100 30 symbol ratings mw ma ma unit page4/7 part no. ldd405/65-xx/rp20
ligitek electronics co.,ltd. property of ligitek only if=20ma test condition if=20ma if=20ma if=10ma vr=5v volt vf forward voltage per chip luminous intensity matching ratio reverse current any chip spectral line half-width peak wavelength luminous intensity per chip iv-m ir iv p a nm mcd nm test condition for each parameter parameter symbol unit 5/7 page part no. ldd405/65-xx/rp20
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 relative intensity vs. temperature ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) fig.2 relative intensity vs. forward current r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40-200204060 1.0 1.1 1.2 600650700750 0.0 0.5 1.0 2.03.04.05.0 80100 0.8 0.9 -20 -4040 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 sr chip page 6/7 part no. ldd405/65-xx/rp20
mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 5 2.dwell time=5 1sec this test intended to see soldering well performed or not. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 1.under room temperature 2.if=10ma 3.t=1000 hrs (-24hrs, +72hrs) this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs thermal shock test solder resistance test high temperature high humidity test 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=260 5 2.dwell time= 10 1sec. low temperature storage test high temperature storage test 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hours. mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reliability test: test item operating life test test condition description reference standard ligitek electronics co.,ltd. property of ligitek only page7/7 part no. ldd405/65-xx/rp20
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